Skip Nav Destination
Close Modal
Update search
Filter
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
- Paper Number
Filter
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
- Paper Number
Filter
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
- Paper Number
Filter
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
- Paper Number
Filter
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
- Paper Number
Filter
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- EISBN
- ISSN
- EISSN
- Issue
- Volume
- References
- Paper Number
NARROW
Format
Subjects
Article Type
Date
Availability
1-1 of 1
Keywords: caprock thickness
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Proceedings Papers
Thomas A. Buscheck, Samuel Julius Friedmann, Yunwei Sun, Mingjie Chen, Yue Hao, Thomas J. Wolery, Roger D. Aines
Publisher: Carbon Management Technology Conference
Paper presented at the Carbon Management Technology Conference, February 7–9, 2012
Paper Number: CMTC-151746-MS
... section. Vertical-Well Sensitivity Study For this section, we modified the RZ model used in the previous section by generalizing it to handle a range of caprock thicknesses (100 to 1000 m) and storage formation thicknesses (40 to 400 m). The bottom of the storage formation was moved to a depth of 2000 m...
